In order to bring about innovation in advanced measurement and analysis technologies that combine new instrumental principles and data interpretation, it is necessary to create a forum where the analytical needs of industry can be extracted, interdisciplinary seeds and knowledge can be gathered, and both industry and academia can discuss, materialize, and create such technologies.
This committee will strategically and rationally link the seeds of technology and information science that are emerging in academia and industry to address the issues faced by industry, and create a virtuous cycle of growth for both industry and academia: sustained enhancement of competitiveness in industry, and direction toward practical application of seeds of technology and new ideas for seeds of technology in academia. In other words, the purpose of our activities is to create a kind of sustainable development “ecosystem of advanced measurement”.

Advanced measurement and analysis technology can be summarized as “verification of principle,” “application of new analysis technology,” “improvement of throughput,” and “generalization of technology". The following working groups have been established within the committee to promote the discussion of each issue, and these issues will be prioritized.

(1) Mass Spectrometry
In semiconductors, etc., the balancing both micro-areas and high sensitivity is a challenge, and it is necessary to discuss integrated analysis techniques for multimodal data. In addition, fusion with information science is essential for data interpretation of complex samples containing unknown factors.

(2) Synchrotron radiation
In hard X-ray region, structural information from atomic to macroscopic scale can be obtained, while in soft X-ray to ultraviolet region, the mechanism of physical properties and functions can be elucidated. In order to take advantage of the powerful and high quality light source performance, new measurement apparatus and methods, and cross-method data linkage are necessary.

(3) Electron microscopy
Atomic-resolution operando analysis is demanded in real working environments such as batteries, while multi-scale analysis technology is required in the field of structural materials. In addition, for the advancement and low power consumption of semiconductors, measurement using electron microscopes and automatic measurement and data analysis utilizing information science are expected, which will be deployed in physical properties research and materials development.

(4) Information science
Information science is involved in all of the above (1) through (3). For the utilization of advanced measurement technology, it is essential to utilize information science and models to identify important factors from feature values. It is necessary to discuss how to integrate information science into advanced measurement with emphasis on how to integrate information science into advanced measurement.

The four WGs will thoroughly discuss the achievement points that each analytical method/analysis technique should aim for, and connect them to the overall discussion. In addition, the WGs will be mutually linked to develop into industry-academia collaborative activities in each of the four exit fields: semiconductors, batteries/energy, iron and steel/materials, and pharmaceuticals/environment.

Sakamoto Tetsuo
Professor,
Kogakuin University

April 2025 to March 2030

Academia: 55
Industry: 36
Total membership: 91