Summary of Research Project Results Under the JSPS FY2000
"Research for the future Program"



1.Research Institution Osaka University
 
2.University-Industry Cooperative Research Committee Microbeam Analysis 141st Committee
 
3.Term of Project FY1996〜FY2000
 
4.Project Number 96R14101
 
5.Title of Project Development of JSPS-Super Electron Microscope

6.Projetct Leader
Name Institution,Department Title of Position
Ryuichi, Shimizu Osaka University Professor Emeritus

7.Core Members

8.Cooperating Researchers

Names Institution,Department Title of Position
Yoshizo, Takai Graduate School of Engineering, Osaka University Professor
Yoshihide, Kimura Graduate School of Engineering, Osaka University Associate Professor
Takashi, Ikuta Faculty of Engineering, Osaka Electro-communication Univ. Professor

9.Summary of Research Results

JSPS-Super Electron Microscope, which was set for the purpose of this project, has been successfully developed. This Super Electron microscope is based on the unique idea to remove spherical aberration by Defocus-Image Modulation Processing (DIMP), enabling the spherical aberration-free image to be observed in real-time (2/30 sec.) under a commercial type electron microscope. Furthermore, this super electron microscope allows for extracting either phase contrast image or amplitude contrast image by simply selecting characteristic weight function used in DIMP, leading to the first successful observation of ultra-high resolution phase contrast image of single Au atom in chain. The real-time DIMP operation has been realized by
(1) a new technical innovation in developing the modulation of accelerating voltage through a floating type high voltage power supply [Patent: 特開平 10-270194] and
(2) development of intelligent CCD camera [Patent: 特許第2884077].
Both of which have obtained patents and marketed the products.
It should be noted that the development of the present JSPS-Super electron microscope was awarded by the Japan Society of Electron Microscopy in 2000. Professor Yoshizo Takai from Osaka University and Mikio Ichihashi from Hitachi Ltd. were the prizewinners. It is also to be mentioned that Mr Kentaro Nishikata (graduate student, Osaka University) was awarded for his paper on the development of intelligent CCD-camera by the International Union of Microbeam Analysis.

10.Key Words

(1)Super electron microscope、(2)Aberration-free-imaging、(3)Defocus-Image-Modulation Processing
(4)Accelerating voltage modulation、(5)Inteligent CCD-camera、(6)Real-time aberration correction
(7)Single atom observation、(8)Surface migration atoms、(9)Phase image extraction

11.References

[Reference Articles]
Author Title of Article
Y. Takai et al. Real Time Defocus Image Modulation Processing Electron Microscope (invited)
Journal Volume Year Pages Concerned
Proc. of the 7th NIRIM Int. Symposium on Advanced Materials 1 2000 65-66

Author Title of Article
K. Nishikata et al. A novel CCD video camera with operation-function incorporated (Student Award)
Journal Volume Year Pages Concerned
Inst. Phys. Conf. Ser. (IUMAS 2000) No.165 2000 483-484

Author Title of Article
T. Kawasaki et al. Phase Reconstruction of Crystalline Samples by Three-Dimensional Fourier Filtering Method
Journal Volume Year Pages Concerned
Proc. of the 7th Asia-Psific Electron Microscopy Conference 1 2000 126-127

Author Title of Article
Y. Takai et. al. Defocus Image Modulation Processing Electron Microscope: Dynamic Observation of Crystal Deformation
Journal Volume Year Pages Concerned
Proc. of the 7th Asia-Psific Electron Microscopy Conference 1 2000 128-129

Author Title of Article
Y. Takai et al. Real-Time Defocus-Image Modulation Processing Electron Microscope:Recent Progresses on Spatial Resolution and Time Resolution
Journal Volume Year Pages Concerned
The International Union of Materials Research Societies, 6th International Conference in Asia 1 2000 a5.5-a5.5

Author Title of Article
T. Kawasaki et al. Construction of Local Area Electron Diffraction Pattern using Through-focus Images
Journal Volume Year Pages Concerned
Proc. of 8th Conference on Frontiers of Electron Microscopy in Material Science 1 2000 100-100

Author Title of Article
Y. Takai Real-time correction of spherical aberration by defocus-image modulation processing (invited)
Journal Volume Year Pages Concerned
Proc. of 8th Conference on Frontiers of Electron Microscopy in Materials Science 1 2000 57-57

Author Title of Article
H. Utsuro et al. Theoretical background of Defocus Image Modulation Processing (DIMP) based on Three Dimensional Optical Transfer Functions (3D-OTFs)
Journal Volume Year Pages Concerned
Optik 112 2001 67-75

Author Title of Article
K. Nishikata et al. Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
Journal Volume Year Pages Concerned
J. Electron Microscopy 50 2001 (in press)

Author Title of Article
K. Nishikata et al. Development of a novel CCD video camera incorporated with operational function for real-time image processing
Journal Volume Year Pages Concerned
Optik 112 2001 (in press)

Author Title of Article
T. Kawasaki et al. Wave field restoration using three-dimensional Fourier filtering method
Journal Volume Year Pages Concerned
Ultramisroscopy   2001 (submitted)

Author Title of Article
T. Kawasaki et al. Construction of local area electron diffraction patterns using through-focus images
Journal Volume Year Pages Concerned
Ultramicroscopy   2001 (submitted)

Author Title of Article
Y. Takai A Novel Approach for Atomic Level Characterization by the JSPS-Super Electron Microscope
Journal Volume Year Pages Concerned
J. Electron Microsopy   2001 (submitted)

Author Title of Article
Y. Takai et al. Dynamic observation of an atom-sized gold wire by phase electron microscopy
Journal Volume Year Pages Concerned
Physical Review Letter   2001 (submitted)


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