193th Measurement and Characterization Platform

There exists many urgent issues related to measurement and characterization technologies, such as how to respond quickly to individual needs for higher sophistication and how to utilize the rapid progress being made in big data and AI technologies. This committee will work to create a platform that brings together stakeholders who provide measurement/analysis equipment with stakeholders who utilize them. In so doing, our aim is to contribute to solving the aforementioned issues by advancing the discussion toward realizing a "measurement and characterization platform."

Taking a perspective of equipment (infrastructure) used in measurement and characterization, the first step of our study will focus on CPS (Cyber Physical System) type technology, which will characterize next generation measurement/analysis equipment. From the viewpoint of knowledge (content) acquired by measurement and characterization technologies, we will also examine the quality of measurement/analysis data, such as their retroactivity, reliability, and reproducibility in AI applications. Ultimately, we aim to contribute to the manufacturing industry by spawning advanced utilization of measurement and characterization technologies.

Committee Chairperson

Shingo Ichimura
President/Professor
Waseda University

Duration

April 2018 to March 2023 (First term, Five years)

Membership Composition   (As of Apr.2019)

Academia: 16
Industry: 17
Total membership: 33