Aims and Goals

Materials and device research and development has become increasingly vigorous as compounds and composites of new materials are developed and devices become increasingly miniaturized and complex. Localized analysis of materials and devices that employs electrons, ions, photons, etc., has become increasingly important in this situation, and microbeam analysis has attracted strong interest and expectations from a wide spectrum of industries, including those dealing with metals, semiconductors, chemistry, and medicine.

With that in mind, this committee’s objectives are to advance research and development in this field and contribute to society through various activities based on academia-industry cooperation, including (1) the development of device and component technologies for microbeam analysis on a variety of materials and devices, from metals and semiconductors to medicine and biology; (2) the training of future academic and industry leaders in the microbeam analysis field; (3) the promotion of international interaction through forums, such as international conferences and bilateral seminars; and (4) the publishing of handbooks and other materials to disseminate information about microbeam analysis.

Research Themes

1.	Research into developing new measurement and analysis equipment
(1)	Development of laser-assisted, wide-angle, three-dimensional atomic probes and three-dimensional atomic-level analysis of actual devices
(2)	Development of nanophase tomographic scanning transmission electron microscopes
(3)	Development of single atom electron sources, and high brightness and highly spin-polarized electron sources
(4)	Development of atomic force microscopes for real-time observation of molecular motion
2.	Methodology research and development that contributes to environmental characterization
3.	Research and development related to micro-analysis and micro-observation technologies with applications in living organisms and medical care

Committee Chairperson

Yahachi Saito Professor Department of Quantum Engineering Nagoya University

Duration

September 2009 to August 2014 (Eighth term, Five years)

Membership Composition

Academia: 69
Industry: 67
Total membership: 136

Committee Achievements and Special Activities

Hosted an international symposium, Atomic Level Characterizations for New Materials and Devices, and published proceedings

Edited and published Microbeam Analysis Handbook

Training seminars and other special activities that contribute to international standardization and interaction

Committee Web Site

http://jsps141.surf.nuqe.nagoya-u.ac.jp/